TURGUNOV N.A.; SOBIROVA SH.A. Decay Of Ni Impurity Accumulations In Si Under The Influence Of Thermal Annealing. American Journal of Applied Science and Technology, [S. l.], v. 5, n. 11, p. 45–49, 2025. DOI: 10.37547/ajast/Volume05Issue11-10. Disponível em: https://www.theusajournals.com/index.php/ajast/article/view/7744. Acesso em: 3 dec. 2025.